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Mineralogical Magazine; December 2000; v. 64; no. 6; p. 983-993
© 2000 Mineralogical Society of Great Britain and Ireland
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In situ high temperature single crystal X-ray diffraction study of a natural omphacite

A. Pavese1,2,*, R. Bocchio3 and G. Ivaldi4

1 Dipartimento Scienze della Terra-Università degli Studi di Milano, Via Botticelli 23, 20133 Milano, Italy
2 National Research Council, Centro di Studio per la geodinamica alpina e quaternaria, Via Botticelli 23, 20133 Milano, Italy
3 Dipartimento Scienze della Terra-Università degli Studi di Milano, Via Botticelli 23, 20133 Milano, Italy
4 Dipartimento Scienze Mineralogiche e Petrologiche-Università degli Studi di Torino, Via Valperga Caluso 35, 10125 Torino, Italy

* E-mail: pavese{at}p8000.terra.unimi.it

In situ high temperature single crystal X-ray diffraction (XRD) experiments have been performed on a chemically quasi-ideal omphacite sample [(Ca0.49Na0.51){sum}1(Mg0.46Al0.48Fe0.063+){sum}1(Si1.97Al0.03){sum}2O6], up to 1000°C. The lattice parameters were studied as a function of temperature, and their thermal expansion coefficients determined. The b and c cell edges show discontinuities as a function of temperature which are interpreted here in terms of intracrystalline cation diffusion processes. Structure refinements have been carried out using data collected at room temperature, at 800°C and at ambient conditions after cooling. The structural behaviour as a function of temperature of chemically quasi-ideal omphacites is compared with those of jadeite and diopside.

KEYWORDS: omphacites, high temperature, thermal expansion




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